IC CAE Certificate in Intelligence and National Security-Critical Technology Studies

Learn how to apply advanced data science and technology skills to issues of intelligence and national security during this intensive 3-day certificate program, which will begin on June 2, 2020, at Rutgers University Inn & Conference Center (New Brunswick - Cook/Douglass Campus).

This Program is open to students with backgrounds in computer science, information technology and informatics, engineering, mathematics or data science, who are interested in learning about opportunities to apply these skills in a national security context. There is a preference for students who have completed coursework in data science, machine learning, artificial intelligence, and/or algorithm design.

The certificate program will provide students with a combination of the foundations of intelligence/national security and practical skills-building, including:

  • Lectures from federal, state, private sector, and academic subject matter experts 
  • Scenario-based simulation exercises and hands-on workshops and tutorials in which students will learn to apply data science skills to intelligence and security-related scenarios
  • Writing and briefing modules led by intelligence analysts
  • A full day conference of academics, practitioners and students presenting and discussing data science/technology developments in the IC and the evolving threat landscape

[Application Closed]

(Accepted students will receive a stipend for their participation)

Applicants must be U.S. Citizens

Students must also bring their own laptops for the duration of the program

Students will be notified of acceptance by March 15, 2019. The Rutgers Consortium for the IC CAE Critical Technology Studies Program consists of Rutgers University, Borough of Manhattan Community College, City College of New York, and New Jersey City University. Qualified students from these institutions are invited to apply. Accepted students will receive a stipend for their participation in the program.

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